AGRIS - 国际农业科技情报系统

Introgression of a 4D chromosomal fragment into durum wheat confers aluminium tolerance

2014

Han, Zhang | Ryan, Peter R. | Yan, ZeHong | Delhaize, Emmanuel


书目信息
114 1 页码 135-144 - 144 ISSN 0305-7364
出版者
Elsevier B.V.
其它主题
Plant characteristics; Aluminium tolerance; Rhizosheath; Homozygosity; Root growth; Taalmt1; Fine roots; Durum wheat; 4d chromosomal fragment; Grain yield; Acid soil; Substitution lines; Kna1
语言
英语
许可
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类型
Journal Article; Text

2024-02-29
MODS